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- Емкость @ Vr, F
- Прямое напряжение
- Обратное постоянное напряжение (Vr) (Max)
- Время обратного восстановления (trr)
- Рабочая температура перехода
- Конфигурация диода
- Средний выпрямленный ток (Io) на диод
- Серия
| Наименование | Описание | Производитель
|
Package / Case
|
Средний выпрямленный ток (Io)
|
Тип диода
|
Вид монтажа
|
Тип корпуса
|
Скорость
|
Ток утечки
|
Прямое напряжение
|
Обратное постоянное напряжение (Vr) (Max)
|
Время обратного восстановления (trr)
|
Рабочая температура перехода
|
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| BY229X-800,127 | DIODE GEN PURP 600V 8A TO220F | NXP USA Inc. | TO-220-2 Full Pack | 8A | Standard | Through Hole | TO-220FP | Fast Recovery =< 500ns, > 200mA (Io) | 400µA @ 600V | 1.85V @ 20A | 600V | 135ns | 150°C (Max) |
| BYC8DX-600,127 | NOW WEEN - BYC8DX-600 - HYPERFAS | NXP USA Inc. | TO-220-2 Full Pack | 8A | Standard | Through Hole | TO-220F | Fast Recovery =< 500ns, > 200mA (Io) | 40µA @ 600V | 2.9V @ 8A | 600V | 20ns | 150°C (Max) |
| BY229X-200,127 | DIODE GEN PURP 150V 8A TO220F | NXP USA Inc. | TO-220-2 Full Pack | 8A | Standard | Through Hole | TO-220FP | Fast Recovery =< 500ns, > 200mA (Io) | 400µA @ 150V | 1.85V @ 20A | 150V | 135ns | 150°C (Max) |
| BYR29-600,127 | NOW WEEN - BYR29-600 - ULTRAFAST | NXP USA Inc. | TO-220-2 | 8A | Standard | Through Hole | TO-220AC | Fast Recovery =< 500ns, > 200mA (Io) | 10µA @ 600V | 1.5V @ 8A | 600V | 75ns | 150°C (Max) |
| BY229-600,127 | DIODE GEN PURP 500V 8A TO220AC | NXP USA Inc. | TO-220-2 | 8A | Standard | Through Hole | TO-220AC | Fast Recovery =< 500ns, > 200mA (Io) | 400µA @ 500V | 1.85V @ 20A | 500V | 135ns | 150°C (Max) |
| BYC8X-600P,127 | NOW WEEN - BYC8X-600P - HYPERFAS | NXP USA Inc. | TO-220-2 Full Pack | 8A | Standard | Through Hole | TO-220F | Fast Recovery =< 500ns, > 200mA (Io) | 20µA @ 600V | 1.9V @ 8A | 600V | 18ns | 175°C (Max) |
| BYC8B-600PQP | DIODE GEN PURP 600V 8A | NXP USA Inc. | TO-263-3, D²Pak (2 Leads + Tab), TO-263AB | 8A | Standard | Surface Mount | D2PAK | Fast Recovery =< 500ns, > 200mA (Io) | 20µA @ 600V | 3.4V @ 8A | 600V | 18ns | 175°C (Max) |
| BY229X-600,127 | DIODE GEN PURP 500V 8A TO220F | NXP USA Inc. | TO-220-2 Full Pack | 8A | Standard | Through Hole | TO-220FP | Fast Recovery =< 500ns, > 200mA (Io) | 400µA @ 500V | 1.85V @ 20A | 500V | 135ns | 150°C (Max) |
| BY329X-1200,127 | DIODE GEN PURP 1.2KV 8A TO220F | NXP USA Inc. | TO-220-2 Full Pack | 8A | Standard | Through Hole | TO-220FP | Fast Recovery =< 500ns, > 200mA (Io) | 1mA @ 1000V | 1.85V @ 20A | 1200V | 145ns | 150°C (Max) |
| BYR29X-600,127 | NOW WEEN - BYR29X-600 - ULTRAFAS | NXP USA Inc. | TO-220-2 Full Pack, Isolated Tab | 8A | Standard | Through Hole | TO-220FP | Fast Recovery =< 500ns, > 200mA (Io) | 10µA @ 600V | 1.7V @ 8A | 600V | 75ns | 150°C (Max) |
| BY329-1200,127 | DIODE GEN PURP 1.2KV 8A TO220AC | NXP USA Inc. | TO-220-2 | 8A | Standard | Through Hole | TO-220AC | Fast Recovery =< 500ns, > 200mA (Io) | 1mA @ 1000V | 1.85V @ 20A | 1200V | 135ns | 150°C (Max) |
| BY329-1000,127 | DIODE GEN PURP 1KV 8A TO220AC | NXP USA Inc. | TO-220-2 | 8A | Standard | Through Hole | TO-220AC | Fast Recovery =< 500ns, > 200mA (Io) | 1mA @ 800V | 1.85V @ 20A | 1000V | 135ns | 150°C (Max) |
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